Abstruct

Solution-processed organic thin film transistors (OTFTs) are an essential building block for next-generation printed electronic devices. Organic semiconductors (OSCs) that can spontaneously form a molecular assembly play a vital role in the fabrication of OTFTs. OTFT fabrication processes consist of sequential deposition of functional layers, which inherently brings significant difficulties in realizing ideal properties because underlayers are likely to be damaged by application of subsequent layers. These difficulties are particularly prominent when forming metal contact electrodes directly on an OSC surface, due to thermal damage during vacuum evaporation and the effect of solvents during subsequent photolithography. In this work, we demonstrate a simple and facile technique to transfer contact electrodes to ultrathin OSC films and form an ideal metal/OSC interface. Photolithographically defined metal electrodes are transferred and laminated using a polymeric bilayer thin film. One layer is a thick sacrificial polymer film that makes the overall film easier to handle and is water-soluble for dissolution later. The other is a thin buffer film that helps the template adhere to a substrate electrostatically. The present technique does not induce any fatal damage in the substrate OSC layers, which leads to successful fabrication of OTFTs composed of monolayer OSC films with a mobility of higher than 10 cm²V^?1 s^?1, a subthreshold swing of less than 100 mV decade^?1, and a low contact resistance of 175 Ω?cm. The reproducibility of efficient contact fabrication was confirmed by the operation of a 10 × 10 array of monolayer OTFTs. The technique developed here constitutes a key step forward not only for practical OTFT fabrication but also potentially for all existing vertically stacked organic devices, such as light-emitting diodes and solar cells.

Paper

Title: Damage-free Metal Electrode Transfer to Monolayer Organic Single Crystalline Thin Films
Publication: Scientific Reports
Author: Tatsuyuki Makita, Akifumi Yamamura, Junto Tsurumi, Shohei Kumagai, Tadanori Kurosawa,  Toshihiro Okamoto, Mari Sasaki, Shun Watanabe*, and Jun Takeya*
DOI: 10.1038/s41598-020-61536-8
Date: 13 March 2020